4. Conclusion and perspective
In this paper, a simulation method is presented to study the degradation process of PV modules. This method relies on a circuit-based model of PV electrical characteristics. The model relates the PV characteristics to the environmental conditions (irradiation and temperature) and to the aging factors of PV modules.
Study on the effects of each aging factor on PV characteristics shows that the decrease of short-circuit current, the main reason of power loss, is mainly caused by optical degradation of PV modules, while the decay of fill factor mainly due to parasitic resistances degradation worsens the power output. PV module designers can benefit from this analysis in minimizing the influence of degradation on PV performance.
Much effort has been made on the investigation of statistical analysis of PV characteristic parameters over time under assumptions on the degradation pattern of each aging factor. In the case studies, different scenarios are considered to investigate the degradation process of PV modules. Numerical results show that the degradation process of PV characteristic parameters can be very complicated depending on the aging patterns of related factors. Generally, the power loss of PV modules tends to increase and the mismatch among PV modules becomes more remarkable through the time. These case studies are based on KC200GT PV modules by enumerating possible degradation rates of aging factors and utilizing degradation data derived from long-term field operation. Practically, the aging patterns highly depend on PV technology and climates that PV modules expose to. The proposed simulation method can be extended to analyze the degradation process of other PV technologies and operating conditions by replacing corresponding model parameters such as Rs, Rp, A, B, and λ0 for a prospective PV technology under a given climate.